Brand：
Price：
Specs：
Measurement principle
Measurement method
Measurement function
Probe Type
Calibrated certificate
Standard
$748.63
SE
KAIRDA NDT151P Roughness Gauge
Z-axis (vertical) 320μm (12600μin); X-axis (horizontal) 17.5mm (0.71inch)Ra、Rz、Rq、Rt、Rmax、Rc、Rp、Rv、R3z、R3y Rz(JIS)、Ry(JIS)、Rs、Rsk Rku、Rsm Rmr、RPc Rk、Rpk Rvk、Mr1、Mr2、TP、Rm1、Rm2、Rm3、Rm4
Multiparameter Ra, Rz, Rq, Rt, Rc, Rp, Rv, R3z, R3y, Rz (JIS), Rs, Rsk, Rsm, Rku, Rmr; Ry (JIS); Rmax, RPc, Rk, Rpk, Rvk, Mr1, Mr2. High-end machines increase parameters such as TP, Rm1, Rm2, Rm3, Rm4; high-end machines increase to 320μm Measurement range.
$653.73
SE
UK ELCOMETER T224C500I Elcometer 224 surface roughness probe, flat
0~500μm(0~20mils)
$728.73
SE
UK ELCOMETER T224C500UARM Elcometer 224 Armored surface roughness instrument probe
0~500μm(0~20mils)
$903.22
SE
UK ELCOMETER T224C500UXARM Elcometer 224 surface roughness probe, convex armour
0~500μm(0~20mils)
$716.48
SE
TQC SP1562 coating Roughness Gauge
0~3,4mm/0~0.13inch
Rapid measurement of pulse height on rough surfaces of varnished film. Measurement range 0-3,4mm/0-0.13inch.
$702.71
SE
LEEB LBTQ914 surface roughness probe asperity detector, multiparameter
Z-axis (vertical) 160μm X-axis (horizontal) 17.5mm
Multiparameter, efficient DSP chip for fast data processing and accurate measurement, rich display information and visual graphics output.
$626.17
SE
KAIRDA NDT150A surface roughness instrument
Z-axis (vertical): 160μm; X-axis (horizontal): 17.5mm (0.69inch)Ra、Rz==Ry(JIS)、Rq、Rt==Rmax、Rp、Rv、R3z、R3y、Rz(JIS)、Rs、Rsk、Rku、Rsm、Rmr、RPc、Rk、Rpk、Rvk、Mr1、Mr2
Measurement range Z axis (vertical): 160μm; X axis (horizontal): 17.5mm (0.69inch), resolution Z axis (vertical) 0.002μm/+/- 20μm; 0.004μm/+/- 40μm; 0.008μm/+/- 80μm, in line with ISO, DIN, ANSI, JIS and other standards.
$592.50
SE
Defelsko PRBSPGCS-B surface profile measuring instrument probe
0~1500μm(0~60mils)
If you don't know how to choose "Roughometer", please consult customer service.