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Specs:
Measurement principle
Measurement method
Measurement function
Probe Type
Calibrated certificate
Standard
$728.73
SE
UK ELCOMETER T224C500UARM Elcometer 224 Armored surface roughness instrument probe
0~500μm(0~20mils)
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$903.22
SE
UK ELCOMETER T224C500UXARM Elcometer 224 surface roughness probe, convex armour
0~500μm(0~20mils)
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$1085.37
SE
KAIRDA NDT161 surface roughness tester, contact asperity tester
Ra、Rz、Rq、Rt、Rc、Rp、Rv、R3z、R3y、Rz(JIS)、Ry、Rs、Rsk、Rku、Rmax、Rsm、Rmr、Rpc、Rk、Rpk、Rvk、Mr1、Mr2Z axis (vertical): 320μm (-160μm~ 160μm)/Ra (0.005-32um) Rz (0.02-320); X axis (horizontal): 17.5mm (0.69inch)
Measurement range Z-axis (vertical): 320μm (-160μm~ 160μm)/Ra (0.005-32um) Rz (0.02-320); X-axis (horizontal): 17.5mm (0.69inch), Sensors Measurement principle: displacement type differential electrical stylus: diamond, 90 taper angle, 5μm tip radius force: stylus force: 4mN; guide force: < 400mN guide: carbide.
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$716.48
SE
TQC SP1562 coating Roughness Gauge
0~3,4mm/0~0.13inch
Rapid measurement of pulse height on rough surfaces of varnished film. Measurement range 0-3,4mm/0-0.13inch.
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$1513.95
SE
KAIRDA NDT180 Roughness Gauge
Ra Rz Rq Rt Rc Rp Rv R3z R3y Rz(JIS)Ry Rs Rsk Rku Rmax Rsm Rmr RPc Rk Rpk Rvk Mr1 Mr2Z-axis (vertical): 640μm (-320μm~ 320μm); X-axis (horizontal): 17.5mm (0.69 inch)
Metal shell, with printing, large range, high-precision, Bluetooth, mobile app.
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$1108.33
SE
DUBAN DB22-SRT234 surface roughness instrument
Ra,Rq,Rz,RtRa,Rq:0.005~16.00μm/0.020~629.9μinchRz,Rt:0.020~160.0μm/0.078~6299μinch
Measurement parameters Ra, Rq, Rz, Rt, Measurement range Ra, Rq: 0.005~ 16.00μm/0.020~ 629.9μinchRz, Rt: 0.020~ 160.0μm/0.078~ 6299μinch, Accuracy ≤ +/- 10%, mechatronics design, small size, light weight, easy to use.
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$1064.55
SE
DUBAN DB22-SRT232 surface roughness instrument
Ra,RzRa;0.05~10.00μm /1.000~400.OμinchRz:0.020~100.0μm /0.780~4000μinch
Execution standard GB/T6062,1S04287, DIN4768, JIS B, ANS146.1, Measurement parameter Ra, Rz, Measurement range Ra; 0.05~ 10.00μm /1.000~ 400.OμinchRz: 0.020~ 100.0μm /0.780~ 4000μinch, Accuracy ≤ +/- 10%, widely used in production site measurement.
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$702.71
SE
LEEB LBTQ914 surface roughness probe asperity detector, multiparameter
Multiparameter, efficient DSP chip for fast data processing and accurate measurement, rich display information and visual graphics output.
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$626.17
SE
KAIRDA NDT150A surface roughness instrument
Ra、Rz==Ry(JIS)、Rq、Rt==Rmax、Rp、Rv、R3z、R3y、Rz(JIS)、Rs、Rsk、Rku、Rsm、Rmr、RPc、Rk、Rpk、Rvk、Mr1、Mr2Z-axis (vertical): 160μm; X-axis (horizontal): 17.5mm (0.69inch)
Measurement range Z axis (vertical): 160μm; X axis (horizontal): 17.5mm (0.69inch), resolution Z axis (vertical) 0.002μm/+/- 20μm; 0.004μm/+/- 40μm; 0.008μm/+/- 80μm, in line with ISO, DIN, ANSI, JIS and other standards.
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$592.50
SE
Defelsko PRBSPGCS-B surface profile measuring instrument probe
0~1500μm(0~60mils)
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