Defelsko PosiTctor RTR H1 Roughometer Standard
The PosiTctor RTR H1 surface Roughometer is a tape replica surface Roughometer of the Defelsko PosiTector series. The PosiTctor RTR H1 surface Roughometer can measure the peak height of 20~ 115μm and is the standard type of the RTR H series.
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Introducing the PositTector RTR H1 Surface Roughness Measuring Instrument
Defelsko The RTR H1 Surface Roughness Measuring Instrument, model standard RTRH1-E, is oneThe standard model of the RTR H-Series Surface Roughness Tester, in one-piece construction, is a digital display spring micrometer and the Testex Press-O-Film uses replica tape to measure and record the surface roughness profile.
Test schematic
Pictures
Features and advantages of the surface roughness measuring instrument
1. Automatically subtract all readings from a 50.8 micron (2 mil) substrate
2. Minimize inspector workload by reducing the number of copies that need to be made to ensure accuracy.
3. The reset function can restore the factory settings immediately
4. The accuracy of measurement is higher than that of spring measuring instrument
5. Durable. The housing has a good degree of protection against solvents, acids, oils, water and dust, and has a rubber housing for shock protection
6. Obtain more accurate peak and valley height value (roughness value) measurement.
7. The calibration certificate can be traced back to PTB
8. The PosiTector main unit is compatible with other PosiTector series probes, such as RTR, SPG, 6000, 200, DPM, UTG.
9. Inverted display can be set
10. Multiple languages are available
11. Mil/micron conversion
12. It can display continuous display of average, standard deviation, min/max height and reading
Comparison of parameters of PositTector RTR series
Model | PosiTector RTR H1 | PosiTector RTR H3 | PosiTector RTR P1 | PosiTector RTR P3 |
Host type | Standard | Advanced | Standard | Advanced |
Probe type | PRBRTRH | PRBRTRP | ||
Measuring Peak (HL) | ● | ● | ● | ● |
Measured peak density (Pd) | ● | ● | ||
Output 2D/3D images | ● | |||
Save the SDF surface data file | ● | |||
Peak (HL) measurement range | 20~115 μm (0.8 to 4.5 mils) | |||
peak(HL) accuracy | ±5 μm (±0.2 mils) | |||
peak(HL) resolution | ±1 μm (±0.2 mils) | |||
Anvil diameter | Ø6.3 mm (Ø0.25 inch) | |||
Anvil pressure | 110g (1.1N) | |||
size | 152x61x28mm | |||
weight | 140g | |||
standard | ASTM D4417、NACE RP0287、SSPC PA 17、SSPC-SP5、SP6、SP10、SP11-87T、AS 3894.5、ISO 8503-5等 |
Defelsko Standard RTRH1-E Surface profile measuring instrumentSpecifications
LIST | VALUE |
---|---|
host type | Standard type |
Probe type | PRBRTRH |
Data storage | 250 readings |
Peak (HL) Measurement range | 20~115 μm (0.8 to 4.5 mils) |
Peak (HL) accuracy | ±5 μm (±0.2 mils) |
Peak (HL) resolution | ±1 μm (±0.2 mils) |
Anvil diameter | Ø6.3 mm (Ø0.25 inch) |
Anvil pressure | 110g (1.1N) |
Dimensions | 152*61*28mm |
Weight | 140g |
standard | ASTM D4417、NACE RP0287、SSPC PA 17、SSPC-SP5、SP6、SP10、SP11-87T、AS 3894.5、ISO 8503-5等 |
Defelsko Standard RTRH1-E Surface profile measuring instrument Packing list
Host x1, Glass zero adjusting plate x1, metal gasket x1, protective rubber cover and belt clip x1, wristband x1, battery x3, manual x1, nylon bag and shoulder strap x1, mirror protective film x1, calibrate certificate x1, USB cable x1
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.
FAQ
- On surface roughness Measuring method Optical inspection, Mechanical, Atomic Force Microscope (AFM)
- Coating surface roughness testing
- IncomingGB/T 44390-2024
- ActiveJJF 1105-2018
- ActiveJJG 2018-1989
- ActiveHB 6172-1988
- IncomingGB/T 42671-2023
- ActiveQB/T 2693-2005
- AbolishASTM D4417-2021
- ActiveGB/T 13288.2-2011
- AbolishGB/T 13288-1991
- AbolishGB/T 6060.5-1988