Integrated circuits are the most widely used electronic components, and they are usually composed of micron-scale semiconductor materials. Because integrated circuits are very sensitive to environmental temperature changes, high-low temperature tests are required to ensure their performance and reliability. The high-low Temperature Test Chamber can simulate various temperature environments, and conduct high-low temperature resistance tests on integrated circuits to detect their performance at different temperatures.
experiment method
The test steps of the high-low Temperature Test Chamber in the high-low temperature resistance test of integrated circuits:
Sample preparation: select a certain number of integrated circuit chips as samples, and perform pretreatment and adjustment before testing as required.
Set test parameters: set the temperature and humidity range, temperature change rate and time of the Test Chamber according to the requirements.
Install the sample: Place the sample inside the chamber and make sure it is in place.
Start the test: start the Test Chamber, carry out the high-low temperature cycle test according to the set parameters, and record the data.
End of the test: After the test is completed, take the sample out of the test box, check its performance and reliability, and analyze the test data.
Generate test reports: Generate test reports based on test results to evaluate the performance and reliability of integrated circuits.
