High-low Temperature Test Chambers are widely used in semiconductor high-low temperature resistance tests. During the operation of semiconductor devices, their electrical performance and reliability will be affected due to temperature changes. Therefore, high-low temperature tests are required to simulate the working state of semiconductor devices at various temperatures to evaluate their performance and reliability.
experiment method
1. Prepare samples: According to the required test standards, select semiconductor devices that meet the requirements, and perform necessary pretreatment and marking.
2. Place the sample: place the sample in the high-low Temperature Test Chamber, and pay attention to the distance and position between the samples to ensure the accuracy of the test results.
3. Set test parameters: According to the required test standards, set the test parameters such as the temperature range of the high-low Temperature Test Chamber, the heating and cooling rate, and the holding time.
4. Conduct the test: start the high-low Temperature Test Chamber, let the sample work at different temperatures for a certain period of time, and observe the performance and reliability of the sample.
5. Analysis results: According to the test results, evaluate the performance and reliability of the sample, determine its applicability, and make necessary improvements.
6. Record data: record various parameters and results during the test for subsequent reference and analysis.
NBCHAO reminds you: When conducting high-low temperature tests on semiconductor devices, it is necessary to follow relevant test standards and safety operating procedures to ensure the accuracy and safety of the test process.
