Low/high Temperature Test Chamber High-low temperature resistance test on IC board

The high-low Temperature Test Chamber has an important application in the high-low temperature resistance test of IC boards. IC board refers to the integrated circuit board, which may encounter different temperature conditions during use, such as high temperature, low temperature, thermal cycle, etc. It is one of the very important components in electronic products and needs to be used in various harsh environments. Keep working. The high-low Temperature Test Chamber can simulate various extreme environmental conditions, and conduct high-low temperature resistance tests on IC boards to ensure its normal operation and stability in different environments.

Picture 1 of high-low Temperature Test Chamber for high-low temperature resistance test of IC board

experiment method

The test steps are as follows:

  1. Prepare the test sample: Install the IC board sample to be tested in the test box to ensure that it is in good contact with the temperature sensor of the test box.

  2. Set test parameters: According to the test requirements, set the high-low temperature of the Test Chamber, heating and cooling rate, holding time and other parameters.

  3. Start the test: start the Test Chamber and let it perform high-low temperature cycle tests according to the preset parameters. During the test, the temperature and working status of the IC board can be monitored in real time.

  4. Observation results: When the test is over, take out the IC board sample and observe its appearance and performance changes, such as whether there are cracks, deformation, damage, etc. At the same time, it is necessary to test its electrical performance, such as whether it works normally, whether the parameters are stable, etc.

  5. Analysis conclusion: According to the test results and data, analyze the resistance performance of the IC board in the high-low temperature environment, and make conclusions and suggestions. If necessary, the test parameters and methods can be adjusted, and the test can be carried out again.

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