Application of low/high Temperature Test Chamber in high-low temperature resistance test of transistor

Transistors are an important part of electronic components. They are also affected by extreme environments such as high temperature and low temperature during use. These environmental conditions may cause changes in the performance and reliability of transistors, which in turn affect the normal operation of electronic equipment. . Therefore, in order to ensure that the transistor can work normally in different environments, it is necessary to conduct high-low temperature resistance tests to evaluate its electrical performance, stability and reliability at different temperatures, so as to ensure its stability and reliability in actual use. performance. High-low Temperature Test Chambers are also widely used in high-low temperature resistance tests of transistors to test the performance and stability of transistors in high-low temperature environments to evaluate their scope of application and service life.

Application of high-low Temperature Test Chamber in high-low temperature resistance test of transistor with picture 1


experiment procedure

(1) Place the transistor to be tested in a high-low Temperature Test Chamber, and adjust the temperature of the Test Chamber to a set high temperature value (for example, 100°C).

(2) Keep the temperature stable for a period of time (such as 1 hour), and then adjust the temperature of the Test Chamber to the set low temperature value (such as -40°C).

(3) Keep the temperature stable for a period of time (for example, 1 hour), and then adjust the temperature of the Test Chamber back to the set high temperature value.

(4) Repeat the above process several times to test the performance and stability of the transistor in alternating high-low temperature environments.

(5) During the test, the parameters of the transistor can be monitored and recorded, such as temperature, current, voltage, etc.

(6) After the test is completed, evaluate the performance parameters and stability of the transistor to determine whether it meets the requirements for use.

NBCHAO reminds you: the high-low temperature test parameters and test standards of transistors may be different, and the specific test steps should be adjusted according to the product type and relevant standards. At the same time, sufficient safety measures need to be taken before the test to ensure that no safety accidents will occur during the test.

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