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$722.00
SE
INESA SGW X-4A Melting point meter
RT+~320℃visualCapillary method, hot table method±1℃(≤200℃)；±2℃(>200℃)±1℃(≤200℃)；±2℃(>200℃)
Support capillary method and hot table method to determine melting point, suitable for crystalline organic compounds in chemical, Spinning & weaving, fuel and other fields. With 40X Microscope magnification, temperature range RT +~ 320 ℃, temperature resolution 0.1 ℃
$843.00
SE
INESA INESA SGW X-4B Melting point meter Melting point meter
RT+~320℃Capillary method, hot table methodvisual±1℃(≤200℃)；±2℃(>200℃)±1℃(≤200℃)；±2℃(>200℃)
Microscope observation method, support capillary method and hot table method. With 0.1 ℃ temperature resolution and +/- 1 ℃ repeability, with Wind Shield to reduce environment interference. Binocular stereo Microscope provides 40X-100X zoom
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