Coating Thickness Gauge

V probe is suitable for cylindrical measurement, range 1500 μm, magnetic induction principle, split probe, measurement accuracy ± 2%, super wear-resistant carbide probe, measurement speed up to 0.3 seconds/time.

Magnetic Induction Thickness Measurement Principle, Thickness Measurement Range 0~2000μm, Accuracy Error +/- 5%, F Split Probe, for measurement of the thickness of non-magnetic conductive coatings on ferromagnetic metal substrates, no supporting software.

LANDTEK hot-selling model, measuring thickness up to 1000μm; External probe, magnetic Induction; Low Voltage prompt; USB and Bluetooth data output can be purchased separately.

Magnetic Induction and eddy Current dual-use Thickness Gauge, can measure the thickness of different metal substrates, thickness range 0~1250μm, error +/- 1~ 3%, no supporting software, support zero, two, multi-point calibrating.

Measurement range 0~1250μm, error range +/- 2%, resolution 0.1μm, can be used to measure the thickness of nonconductive coatings on non-ferrous metal substrates.

Split, magnetic Induction eddy Current dual-use thickness measurement method, can store 500 Measured values, unique temperature compensation algorithm.

Measurement range 0~1250μm, error range +/- 3%, resolution 0.1μm, widely used in chemical industry, light industry, Eletroplating, anti-corrosion, automotive, shipbuilding, aerospace, aviation, commodity inspection and other fields.

Reaction time 0.5s; Aluminum dual function; Measurement; Split probe; Range 0-2000um; Error range ± (3% + 2um of reading); Minimum matrix Film thickness Fe0.2mm/NFe0.05mm.

Measurement range 0~1250μm, error range +/- 2%, resolution 0.1μm, probe contact parts plated hard chrome or ruby, durable, with automatic identification probe function, for measurement of magnetic metal substrate on the nonmagnetic Coating thickness.

Magnetic Induction + eddy Current, Measurement range 0~500μm, error range +/- 3%, resolution 0.1μm | 1μm, minimum measurement surface φ 26mm, meet the standards ISO2178, ISO2360, GB4956, GB4957

Magnetic eddy current dual function, thickness measurement accuracy +/- 3%; automatic memory calibrated value, optional RS-232C/USB/Bluetooth data processing interface.

Built-in thickness probe, magnetic Induction and eddy Current dual-use thickness measurement, thickness measurement range 0~1250μm, error +/- 3%, support single and continuous measurement, optional Interface transmission data.

Coating Thickness Gauge, measurement of non-conductive coated Film thickness on non-metallic substrates, thickness measurement range 0~1250μm, accuracy ± 3%, one point calibrated mode, can store 500 measurement values.

1250 micron range, ± 3% error, eddy current thickness measurement; storage capacity 500 readings; limits can be set.

Magnetic Induction, Measurement range 0~1250μm, error range +/- (1% -3%) H + 1.5μm, resolution 0.1μm /1 μm, Display screen 2.3 inch large color screen

1250 micron range, +/- 3% error, magnetic Induction thickness measurement; Storage capacity 500 readings; bounds can be set.

Measurement range 0~1500μm, Measurement accuracy +/- 2% H + 1μm, can quickly, nondestructive, precise coating, platings thickness measurement, widely used in manufacturing, metal processing, chemical industry, commodity inspection and other testing fields, is a common instrument for material protection.

Measurement range 0~1500μm, optional Measurement range 0-2000μm, 0-3000μm, resolution 0.1μm (0-99.9 μm), the thinnest substrate 0.3mm, widely used in manufacturing, metal processing industry, chemical industry, commodity inspection and other testing fields.

Using magnetic Induction and eddy Current automatic conversion technology, Measurement range 0~3000μm, resolution 0.1μm, with super wear-resistant carbide probe, wear-resistant more than 500,000 times, Measurement speed 0.3 seconds/time.

LANDTEK hot-selling model, measuring thickness up to 1000 μm, standard dual probe; automatic memory calibrating and substrate identification; Single and continuous Measurement mode; optional USB and Bluetooth data output.