$615.00
SE
LEEB400 Portable Roughness Gauge Measurement parameters Ra, Rz, Rq, Rt
Ra、Rz、Rq、RtRa:0.05-10.0μm Rz:0.1-50μm
Piezoelectric crystal Sensors, stroke length 6mm, range Ra: 0.05-10 μm, Sensors probe with protective gate, high-speed DSP processor for data processing and calculation.
$1159.00
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KAIRDA NDT161 surface roughness Tester, contact asperity Tester
Ra、Rz、Rq、Rt、Rc、Rp、Rv、R3z、R3y、Rz(JIS)、Ry、Rs、Rsk、Rku、Rmax、Rsm、Rmr、Rpc、Rk、Rpk、Rvk、Mr1、Mr2Z axis (vertical): 320μm (-160μm~ 160μm)/Ra (0.005-32um) Rz (0.02-320); X axis (horizontal): 17.5mm (0.69inch)
Measurement range Z-axis (vertical): 320μm (-160μm~ 160μm)/Ra (0.005-32um) Rz (0.02-320); X-axis (horizontal): 17.5mm (0.69inch), Sensors Measurement principle: displacement type differential electrical stylus: diamond, 90 taper angle, 5μm tip radius force: stylus force: 4mN; guide force: < 400mN guide: carbide.
$692.00
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KAIRDA NDT150A Surface Roughness Tester
Z-axis (vertical): 160μm; X-axis (horizontal): 17.5mm (0.69inch)Ra、Rz==Ry(JIS)、Rq、Rt==Rmax、Rp、Rv、R3z、R3y、Rz(JIS)、Rs、Rsk、Rku、Rsm、Rmr、RPc、Rk、Rpk、Rvk、Mr1、Mr2
Measurement range Z axis (vertical): 160μm; X axis (horizontal): 17.5mm (0.69inch), resolution Z axis (vertical) 0.002μm/+/- 20μm; 0.004μm/+/- 40μm; 0.008μm/+/- 80μm, in line with ISO, DIN, ANSI, JIS and other standards.
$1138.00
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DUBAN DB22-SRT232 Surface Roughness Tester
Ra,RzRa;0.05~10.00μm /1.000~400.OμinchRz:0.020~100.0μm /0.780~4000μinch
Execution standard GB/T6062,1S04287, DIN4768, JIS B, ANS146.1, Measurement parameter Ra, Rz, Measurement range Ra; 0.05~ 10.00μm /1.000~400.OμinchRz: 0.020~100.0μm /0.780~4000μinch, Accuracy ≤ +/- 10%, widely used in production site measurement.
$1182.00
SE
DUBAN DB22-SRT234 Surface Roughness Tester
Ra,Rq:0.005~16.00μm/0.020~629.9μinchRz,Rt:0.020~160.0μm/0.078~6299μinchRa,Rq,Rz,Rt
Measurement parameters Ra, Rq, Rz, Rt, Measurement range Ra, Rq: 0.005~ 16.00μm/0.020~629.9μinchRz, Rt: 0.020~160.0μm/0.078~ 6299μinch, Accuracy ≤ +/- 10%, mechatronics design, small size, light weight, easy to use.
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