NBCHAO.Com SN: NB012544
PHYNIX Surfix®E-FN Dual-use Statistical Film thickness meter
PHYNIX Surfix ® E - FN dual-use statistical film thickness meter with FN1.5 external fixed probe, Measurement range 1~ 1500μm, Surfix FN Film thickness meter Measurement accuracy +/- 1% resolution 0.1μm. With infrared interface, Protection level IP52.
PHYNIX Surfix®E-FN Dual-use Statistical Film thickness meterKey Spec.
Measurement principle
Magnetic Induction + eddy Current
Measurement range
0~1500μm
margin of error
±1%
Surfix®E-FN Dual-use Statistical Film thickness meter
Details
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