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PHYNIX Surfix®E-F Film thickness meter based on iron
Surfix ® E Family Series Surfix F is an iron-based statistical film thickness meter, with F1.5 external fixed probe, Measurement range 1~ 1500μm, can measure the film thickness on magnetic metal (iron/steel) substrate, accuracy +/- 1%.
PHYNIX Surfix®E-F Film thickness meter based on ironKey Spec.
Measurement principle
magnetic Induction
Measurement range
0~1500μm
margin of error
±1%
Surfix®E-F Film thickness meter based on iron
Details
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