PHYNIX Surfix®E-N Film thickness meter

Surfix ® E Family Series Surfix N is a non-iron based statistical film thickness meter, with N1.5 external fixed probe, Measurement range 1~ 1500μm, Surfix galvanized layer Thickness Gauge adopts eddy Current Measurement principle to measure non-ferrous metal substrate coated platings, Measurement accuracy +/- (1μm + 1% Measured value), resolution up to 0.1μm. With infrared interface for convenient data transmission, host Protection level IP52.