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PHYNIX Surfix® E-N basic Film thickness meter
PHYNIX Surfix ® E-N basic Non-ferrous statistical film thickness meter is the basic model of Surfix N, also with N1.5 external fixed probe, the difference is that it cannot save data, no statistical function, limit value, zero drift, no interface and screen backlight function.
PHYNIX Surfix® E-N basic Film thickness meterKey Spec.
Measurement principle
magnetic Induction
Measurement range
0~1500μm
margin of error
±1%
Surfix® E-N basic Film thickness meter
Details
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