BOZHEN GDW8025 low/high Temperature Test Chamber -80~130 ℃/250L
BOZHEN GDW8025 low/high Temperature Test Chamber Temperature range -80 ℃~ + 130 ℃, Temperature fluctuation ≤ +/- 0.5 ℃, Temperature uniformity ≤ + 2 ℃, Interior size 600 × 520 × 800mm, liner material is 304 stainless steel.
BoZhen
GDW8025
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Application
It is used for high-low temperature reliability test of industrial products. For the components and materials of related products such as electronics, automobiles, aerospace, ship weapons, colleges and universities, scientific research units, etc., test their performance indicators at various temperatures.
Features
1. The main components are imported, with excellent performance, beautiful appearance and good reliability. It is an excellent choice for laboratory environmental test equipment.
2. It has a wide temperature control range, which can meet various needs of users.
3. Using a unique balanced temperature adjustment method, it has a stable and balanced heating capacity, and can perform high-precision and high-stable temperature control.
Standards
GB10592-89 high-low Temperature Test Chamber technical conditions
GB2423.1 Test A: Low temperature test method
GB2423.2 Test B: High temperature test method
BoZhen GDW8025 Low/high Temperature Test ChamberSpecifications
| LIST | VALUE |
|---|---|
| Temperature range | -80~130℃ |
| Temperature fluctuation | ≤±0.5℃ |
| Temperature Uniformity | ≤+2℃ |
| Input power | 8kw |
| Power | 380V/50HZ |
| Interior size | 600*520*800mm |
| Dimensions | 1060*890*1900mm |
| Inner chamber material | 304 stainless steel |
| Enclosure Material | Cold rolled iron plate lame plating (optional custom 316L stainless steel) |
BoZhen GDW8025 Low/high Temperature Test Chamber Packing list
completeness-built unit X1, operation manual X1, warranty card X1, certificate of conformity X1
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.
FAQ
- Low/high Temperature Test Chamber for high-low temperature resistance test of insulating potting materials
- Low/high Temperature Test Chamber for high-low temperature resistance test of graphite batteries
- Application of low/high Temperature Test Chamber in high-low temperature resistance test of transistor
- Low/high Temperature Test Chamber on PCB substrate
- Low/high Temperature Test Chamber for testing high-low temperature resistance of silicone oil
- Low/high Temperature Test Chamber in semiconductor discrete devices
- Low/high Temperature Test Chamber Testing steel plate high-low temperature performance
- Application of low/high Temperature Test Chamber in Wire and cable resistance test
- Low/high Temperature Test Chamber for testing Rubber high-low temperature resistance
- Low/high Temperature Test Chamber applications
- ActiveGB/T 2424.7-2024
- ActiveJB/T 4278.8-2011
- ActiveGB/T 9979-2005
- ActiveGB/T 39933-2021
- ActiveGB/T 10590-2006
- ActiveGB/T 33861-2017
- ActiveGB/T 10592-2023
- ActiveGB/T 2423.63-2019
- Active 10590-2006
- ActiveGB/T 41166-2021
- ActiveGB/T 2423.102-2008
- AbolishGB/T 2423.34-2005
- AbolishGB/T 2423.25-2008
- ActiveGB/T 10589-2008
- ReplacedGB/T 10592-2008
- ActiveGJB 150.4A-2009
- ActiveGB/T 2423.2-2008
- ActiveGB/T 2423.1-2008
- ActiveJB/T 13229-2017
- ActiveGB/T 10586-2006