DAKOTA PT-044-2000 Ultra Thick High Temperature Probe
The DAKOTA ultra-thick high temperature probe PT-044-2000 has a diameter of 1/2 " (Ø 12.7mm) and is a 5MHz Frequency Ultrasonic Thickness Gauge dual crystal probe. The thickness range of PT-044-2000 is 1.27~ 508mm, which can be used for thickness measurement in high temperature environments up to 340 ℃.
DAKOTA-
LEEB331 Metal Ultrasonic Thickness Gauge Speed of sound adjustable
$ 332.00 -
KAIRDA TSTU32 Ultrasonic Thickness Gauge Probe
Login -
DONGRU DR83S Ultrasonic Thickness Gauge 300mm/0.1mm
$ 148.00 -
LANDTEK TM8816C Ultrasonic Thickness Gauge for thickness measurement of various ultrasonic conductors
$ 381.00 -
KAIRDA NDT361 Penetrable coating Thickness Gauge 0.15-20 mm
$ 1081.00
Introduction
The DAKOTA ultra-thick high-temperature probe PT-044-2000 has a diameter of 1/2" (Ø12.7mm) and is a 5MHz frequency ultrasonic Thickness Gauge dual element transducer, with a thickness measurement range of 1.27~508mm, which can be used for thickness measurement in high temperature environments up to 340°C.

PT Series Thickness Gauge Probe Parameters
| Model | Thickness range | frequency | Probe diameter | High temperatures |
| PT-102-2000 | 1.0~152mm | 5MHz/wafer | Ø6.35mm | |
| PT-102-2700 | 1.0~152mm | 5MHz/wafer | Ø6.35mm | |
| PT-102-2900 | 1.0~152mm | 5MHz/wafer | Ø6.35mm/CT mode | |
| PT-104-9700 | 2.54~100mm/3.2-100mm(Penetration mode) | 3.5MHz/wafer | Ø12.7mm | |
| PT-101-2000 | 1.0~50mm | 5MHz/wafer | Ø4.76mm | |
| PT-101-2700 | 1.0~50mm | 5MHz/wafer | Ø4.76mm | |
| PT-104-0000 | 3.8~50.8mm(Medium Cast Iron) | 1MHz/wafer | Ø12.7mm | |
| PT-102-1000 | 1.5~100mm | 2.25MHz/wafer | Ø6.35mm | |
| PT-102-3300 | 0.63~152mm | 7.5MHz/wafer | Ø6.35mm | |
| PT-102-3700 | Penetration mode: 5.0~25.4m | 7.5MHz/wafer | Ø6.35mm | |
| PT-104-2000 | 1.27~508mm | 5MHz/wafer | Ø12.7mm | |
| PT-104-2700 | 1.27~508mm | 5MHz/wafer | Ø12.7mm | |
| PT-042-2000 | 1.0~152mm | 5MHz/wafer | Ø6.35mm | 340℃ |
| PT-042-2700 | 1.0~152mm | 5MHz/wafer | Ø6.35mm | 340℃ |
| PT-044-2000 | 1.27~508mm | 5MHz/wafer | Ø12.7mm | 340℃ |
| PT-044-2700 | 1.27~508mm | wafer | Ø12.7mm | 340℃ |
| PT-212-2001 | 1.0~152mm | 5MHz/wafer | Ø6.35mm | 480℃ |
| PT-214-2001 | 1.27~508mm | 5MHz/wafer | Ø12.7mm | 480℃ |
| PT-104-2120 | With PR-82/1.27~380mm | 5MHz | R=50mm | |
| PT-074-2906 | 2.54~100mm | 5MHz/UMX-2 | Ø12.7mm |
DAKOTA PT-044-2000 Ultra thick high temperature probeSpecifications
| LIST | VALUE |
|---|---|
| Measurement range | 1.27~508mm |
| Probe Frequency | 5MHz |
| Probe diameter | Φ12.7mm |
| Probe style | dual crystal probe |
| Temperature range | 340℃ |
DAKOTA PT-044-2000 Ultra thick high temperature probe Packing list
Probe x1
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.


PT-044-2000





