Taylor Hobson CCI MP-HS Optical inspection Profile Gauge

Introduction to the CCI MP-HS Optical Profiler

No matter what component is being measured, no matter how high the speed of analysis is required, our innovative CCI MP-HS non-contact optical profiler provides you with precise 3D surface measurements. The combination of a million high-speed cameras with 1/10 angstrom vertical resolution results in incredibly detailed analysis, whether measuring very rough surfaces or very smooth surfaces.

The CCI MP-HS greatly expands the analytical capabilities without complicating the analysis procedure. You can measure a wide variety of components and surfaces without the need for complex measurement mode switching or the additional burden of intermediate lens calibration. With standardized methods, procedures, and reporting, CCI MP-HS can be easily integrated into your quality management system.

CCI MP-HS Optical Profiler Advantages:

1048 x 1048 pixel array, wide field of view, high resolution

Advanced X, Y, Z splicing, extended range

RMS repeatability < 0.2 angstroms, step height repeatability < 0.1%

Integrated anti-vibration for optimized noise immunity

Multi-language version of Windows, 64-bit software

Illustration of the CCI MP-HS optical profiler

[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.