Taylor Hobson CCI MP Contactless 3D Profile Gauge

Introducing the CCI MP Non-Contact 3D Profiler

The CCI MP is an advanced measurement interferometer (non-contact 3D profiler). It uses a novel correlation algorithm to find the coherent peaks and phases of the interferogram generated by our precision optical scanning device.

CCI MP is useful for many applications that require high-precision 3D profiling of the profile. A wide variety of subject matter can be assembled simultaneously on the turret, so that many types of surfaces can be measured. The flexibility of the measurement is further enhanced by the fully automated workbench and automatic measuring program.

One of the key advantages of the CCI MP non-contact 3D profiler is its versatility and versatility. Polished, rough, curved, flat or stepped surfaces with a reflectivity of 0.3% to 100% can be measured using a single algorithm, without the need to change modes for different surfaces or to worry about choosing the wrong mode. Measurable material types include: glass, liquid inks, photoresists, metals, polymers, and pastes.

Advantages of CCI MP Non-Contact 3D Profiler:

1048 x 1048 pixel array, wide field of view, high resolution

New and improved X, Y and Z splicing with capacities of up to 100 mm

RMS repeatability < 0.2 angstroms, step height repeatability < 0.1%

Full-scale angstrom-level resolution

Multi-language version of Windows 7, 64-bit software

Illustration of the CCI MP non-contact 3D profiler

[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.