Defelsko PosiTctor RTR H3 Advanced Surface Profile Roughness Gauge
The Defelsko PosiTctor RTR series Surface Profile Roughness Gauge is a tape replication method surface roughness meter, the RTR H3 Surface Profile Roughness Gauge is an advanced model, and the Profile Gauge measurement has a peak and valley value range of 20~115μm.
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Introducing the PosiTctor RTR H3 Surface Profile Tester
The Defelsko PosiTctor RTR H3 is an advanced model of the RTR H-Series Surface Profile Gauge, a color LCD display with 100,000 measurement readings and advanced features such as real-time graphical display.PosiTctor RTR H3The measurement range of the surface profile roughness Tester is 20~115μm, and the measurement accuracy is ±5μm.
Test schematic

PositTector Illustration of the RTR H3



PositTector RTR H3 Surface Roughness Measuring Instrument Applicable Standards
符合标准ASTM D4417、NACE RP0287、SSPC PA 17、SSPC-SP5、SP6、SP10、SP11-87T、AS 3894.5、ISO 8503-5.
PositTector Features and benefits of the RTR H3 Surface Roughness Measuring Instrument
1. Color LCD screen, with a storage capacity of 100,000 measurement readings.
2. Real-time graphics, picture prompts and automatic batches
3. Bluetooth wireless technology transmits data
4. A 50.8 micron (2 mil) substrate capable of automatically subtracting all readings
5. Minimize inspector workload by reducing the number of copies that need to be made to ensure accuracy.
6. The reset function can restore the factory settings immediately
7. The accuracy of measurement is higher than that of spring measuring instrument
8. Durable. The housing has a good degree of protection against solvents, acids, oils, water and dust, and has a rubber housing for shock protection
9. Obtain more accurate measurement of peak and valley height value (roughness value).
10. The calibration certificate can be traced back to PTB
11. The PosiTector main unit is compatible with other PosiTector series probes, such as RTR, SPG, 6000, 200, DPM, UTG.
12. Inverted display can be set
13. It can display continuous display of average value, standard deviation, min/max height and reading
Comparison of parameters of PositTector RTR series
| Model | PosiTector RTR H1 | PosiTector RTR H3 | PosiTector RTR P1 | PosiTector RTR P3 |
![]() | ![]() | ![]() | ![]() | |
| Host type | Standard | Advanced | Standard | Advanced |
| Probe type | PRBRTRH | PRBRTRP | ||
| Measuring Peak (HL) | ● | ● | ● | ● |
| Measured peak density (Pd) | ● | ● | ||
| Output 2D/3D images | ● | |||
| Save the SDF surface data file | ● | |||
| Peak (HL) measurement range | 20~115 μm (0.8 to 4.5 mils) | |||
| peak(HL) accuracy | ±5 μm (±0.2 mils) | |||
| peak(HL) resolution | ±1 μm (±0.2 mils) | |||
| Anvil diameter | Ø6.3 mm (Ø0.25 inch) | |||
| Anvil pressure | 110g (1.1N) | |||
| size | 152x61x28mm | |||
| weight | 140g | |||
| standard | ASTM D4417、NACE RP0287、SSPC PA 17、SSPC-SP5、SP6、SP10、SP11-87T、AS 3894.5、ISO 8503-5等 | |||
Defelsko Advanced RTRH3-E Surface profile measuring instrumentSpecifications
| LIST | VALUE |
|---|---|
| host type | Advanced |
| Probe type | PRBRTRH |
| Data storage | 100,000 readings |
| Peak (HL) Measurement range | 20~115 μm (0.8 to 4.5 mils) |
| Peak (HL) Accuracy | ±5 μm (±0.2 mils) |
| Peak (HL) resolution | ±1 μm (±0.2 mils) |
| Anvil diameter | Ø6.3 mm (Ø0.25 inch) |
| Anvil pressure | 110g (1.1N) |
| Dimensions | 152*61*28mm |
| Weight | 140g |
| standard | ASTM D4417、NACE RP0287、SSPC PA 17、SSPC-SP5、SP6、SP10、SP11-87T、AS 3894.5、ISO 8503-5等 |
| Statistical function | Average, standard deviation, min/max height and readings |
Defelsko Advanced RTRH3-E Surface profile measuring instrument Packing list
Host x1, Glass zero adjusting plate x1, metal gasket x1, protective rubber cover and belt clip x1, wristband x1, battery x3, manual x1, nylon bag and shoulder strap x1, mirror protective film x1, calibrate certificate x1, USB cable x1
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.
FAQ
- On surface roughness Measuring method Optical inspection, Mechanical, Atomic Force Microscope (AFM)
- Coating surface roughness testing
- GB/T 44390-2024
- ActiveJJF 1105-2018
- ActiveJJG 2018-1989
- ActiveHB 6172-1988
- ActiveGB/T 42671-2023
- ActiveQB/T 2693-2005
- AbolishASTM D4417-2021
- ActiveGB/T 13288.2-2011
- AbolishGB/T 13288-1991
- AbolishGB/T 6060.5-1988


Advanced RTRH3-E









