TEELEN XTL-12B Inverted Metallurgical Microscopy Low Matching

Instrument Introduction

• Using professional metallographic objective lenses and flat-field eyepieces, the image quality is good, the resolution is high, and the observation is comfortable.

• Provides superior image quality and a solid and reliable mechanical structure.

• Equipped with corresponding photographic and video camera accessories, the observed images can be collected and saved, and the computer and professional metallographic analysis software images can be used for metallographic image analysis.

• It is easy to operate and has complete accessories. It is widely used in teaching and scientific research metallographic analysis, semiconductor silicon wafer detection, address mineral analysis , precision engineering measurement and other fields.

Instrument host x1, objective lens: 5X/10X/20X/50X each, eyepiece: 10X/18mm eyepiece x1 pair, observation head x1 binocular head, 0.5 times C interface x1, plug-in LED Light source assembly x1, stainless steel round plate x1, color filter rod x2, 6.30 million imagery system x1, imagery software (USB) x1, 3.0USB data transmission cable x1, power cable x1, dust cover x1, manual warranty card x1

[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.