KESIONOTS experiment high and low temperature test box KS-OTS-HD80LC temperature control -40 ℃~ 150 ℃
Temperature control -40 ℃~ 150 ℃, volume 80L, the outer box is high-grade cold plate nano-paint, the inner box is stainless steel, air-water cooled double-stage compressor refrigeration, used for high temperature and low temperature cycle change test.
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Introduction
The high-low Temperature Test Chamber, also known as the environmental Test Chamber, is suitable for high temperature and low temperature reliability tests of industrial products. For components and materials of related products such as electronics, automobiles and motorcycles, aerospace, ship weapons, colleges and universities, scientific research units, etc., under the condition of high temperature and low temperature (alternating) cyclical changes, test their various performance indicators to carry out product testing. Design, improvement, identification and inspection and other links, such as: aging test.
◆Aging: This machine promotes the deterioration of vulcanized rubber to calculate the change rate of tensile force and elongation before and after heating. It is generally believed that one day of testing at 70°C is equivalent to six months of exposure to the atmosphere in theory.
◆The product has a wide range of temperature control, and its performance indicators have reached the technical conditions of the national standard GB10592-89 high-low Temperature Test Chamber. It is suitable for environmental testing of electrical and electronic products according to GB2423. Test B: High temperature test method "Carry out low temperature, high temperature test and constant temperature test on the product. The products comply with GB2423.1, GB2423.2, GJB150.3, GJB150.4, IEC, MIL standards.
kesionots KS-OTS-HD80LC low/high temperature test ChamberSpecifications
| LIST | VALUE |
|---|---|
| Temperature range | -40℃~150℃ |
| Interior Volume | 80L |
| Working size | 400x500x400mm |
| Outer box size | 880x1370x1000mm |
| Temperature analysis Accuracy | ±0.1℃ |
| Temperature Uniformity | ±1.0℃ |
| Temperature control Accuracy | ±1.0℃ |
| Temperature fluctuation | ±0.5℃ |
| heating time | About 4.0 ℃/min |
| Cooling time | About 1.0 ℃/min |
| Inner box material | stainless steel |
| Enclosure Material | Advanced cold plate nano paint |
| Thermal insulation material | High temperature resistant high density ethyl chloroformate foam insulator material |
| Chill down the system | Air and water cooled/dual stage compressor |
| Thermal insulation material | High temperature resistant high density ethyl chloroformate foam insulator material |
| Protection device | Fuseless switch, compressor overload protection switch, refrigerant high and low Voltage protection switch, ultra-humidity over-temperature protection switch, fuse, fault warning system |
| Accessories | Viewing window, 50mm test hole, PL box light, baffle, wet and dry ball gauze |
| Controller | Choose from Korean or Japanese "OYO" cards |
| compressor | French "Taikang" brand or German "Bitzer" |
| Power | 1 220VAC±10%50/60Hz & 3 380VAC±10%50/60Hz |
kesionots KS-OTS-HD80LC low/high temperature test Chamber Packing list
host X1, manual X1, certificate X1, warranty card X1
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.
FAQ
- How to deal with the unstable heating and humidity of the low/high Temperature Test Chamber?
- Low/high Temperature Test Chamber LED packaging adhesive resistance to high-low temperature test scheme
- Low/high Temperature Test Chamber applied to high-low temperature resistance test of hot boiler
- Low/high Temperature Test Chamber for high-low temperature resistance test of fluoroether rubber sealing materials
- Application of low/high Temperature Test Chamber in high-low temperature resistance test of spacecraft magnetic torque device
- Low/high Temperature Test Chamber for vehicle exhaust remote sensing detection system
- Resistant low/high Temperature Test Chamber for main board resistance to high-low temperature test
- Application of low/high Temperature Test Chamber in high-low temperature resistance test of silicon wafers
- Application of low/high Temperature Test Chamber in high-low temperature resistance test of cast iron materials
- Application of low/high Temperature Test Chamber in high-low temperature resistance performance detection of magnetic materials
- ActiveGB/T 2424.7-2024
- ActiveJB/T 4278.8-2011
- ActiveGB/T 713.1-2023
- ActiveGB/T 9979-2005
- ActiveGB/T 39933-2021
- ActiveGB/T 10590-2006
- ActiveGB/T 33861-2017
- ActiveGB/T 10592-2023
- ActiveGB/T 2423.63-2019
- ActiveGB/T 32710.11-2016
- ActiveGB/T 2423.102-2008
- ActiveASTM D2485-2022


KS-OTS-HD80LC






