China domestic (CN) NBC-50E Thermal Shock Test Chamber High and Low Temperature Impact Tester

Introduction

High-low temperature thermal shock Test Chambers are used in electronic and electrical components, automation parts, communication auto parts, metals, chemical materials, plastics and other industries, defense industry, aerospace, ordnance industry, BGA, PCB base plate, electronic chips The physical changes of IC, semiconductor ceramics and polymer materials are tested by testing the material's repeated resistance to high-low temperatures and the chemical changes or physical damage produced by the product due to thermal expansion and contraction. The quality of the product can be confirmed from precision From IC to heavy machinery components, they can be used as a basis or reference for product improvement.

Features

• The Three-Chamber equipment area is divided into three parts: high-temperature area, low-temperature area, and test area. The test product is placed in the test area. During impact, the temperature of the high-temperature area or low-temperature area rushes into the test area for impact. The test product is static.

• It adopts touch-control graphic control interface and is easy to operate.

• The impact method uses the air path switching method to bring the temperature into the test area for hot and cold impact testing.

• In case of high temperature shock or low temperature shock, the maximum time can reach 999h and the maximum cycle can reach 9999 times.

• The system can be used as an automatic cycle engine or manual selective impact. It can set two or three zones of impact and cold, heavy and hot start.

• The cooling adopts a binary refrigeration system, which has a rapid cooling effect, and the cooling method is water cooling. You can test the impact at normal temperature

Standards compliant

1.GB-2423.1-89 (EC68-2-1) Test A: Low Temperature Test Method

2.GB-2423.2-89 (IEC68-2-2) Test B: High Temperature Test Method

3.GJB360.8-87 (MIL-STD-202F) high temperature life test

4.GBJ150.3 (MIL-STD-810D) high temperature test method

5.GJB150.4 (MIL-STD-810D) low temperature test method

6.National military standard GJB150.3-86

7.National military standard GJB150-86

8.National military standard GJB150.5-86

Comparison of parameters of hot and cold shock Test Chamber series

host X1, manual X1, certificate X1, warranty card X1

[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.