TEELEN XTL-20B Metallurgical Microscopy Infinite High Light Reuters reflection Double Illuminant

1. Instrument introduction

1. Clear, sharp and high-contrast microscopic images can be obtained under various observation methods. The complete accessories and complete configuration can flexibly combine the system and expand the functions. Ergonomic design with solid and reliable system structure.

2. This cost-effective microscope is capable of inspecting a wide range of devices and wafers. The focus mechanism and the illumination intensity control are next to each other and can be operated with the same hand. It is especially suitable for small and medium-sized semiconductor FPD inspection and circuit board slicing measurement, which meets industry standards and enhances safety and reliability.

3. The ultra-cost-effective brightfield optical system adopts infinite optical path technology, integrating brightfield, oblique illumination, polarization and other observation methods, which can present clear and sharp microscopic images under any observation, and can be selected according to the actual application, which is an effective tool for industrial testing.

2. Instrument characteristics

1. High-definition mirroring, no blurred edge of the field of view, high-definition in full view

2. Light field compensation, which can remove the reflective exposure point in the mirror image

3. The appearance is novel, and the whole machine is made of lead-free and environmentally friendly material

4. Transmissive dual light sources, which can observe transparent or non-transparent samples to achieve multi-purpose functions in one machine

5. With the original imaging system, it can realize the mirror screen display effect

[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.