TEELEN WTN-202S Tool measurement Metallographic measurement Microscope High Accuracy measuring instrument
Adopt infinite distance Brightfield metallographic objective to meet long working distance measurement; X, Y coordinate measurement Indication Error ≤ (3 + L/150) µm to achieve High Accuracy; Equipped with variable aperture diaphragm, it can perform non-diffraction observation measurement.
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WTN-202S
Product Introduction
WTN-202S measuring microscope series is a high-precision and high-efficiency micromeasuring instrument integrating software, optical, mechanical and electrical;
The WTN-202S measuring microscope series is a lineup of microscopes that systematize observation, measurement and processing;
WTN-202S measurement microscope can be used as an observation microscope to check the surface shape of the workpiece by relative measurement method for the purpose of non-contact measurement, and is one of the indispensable metrology and testing equipment in the metrology room, laboratory and production workshop.
Product features:
The wide field of view allows for clear flicker-free images
High-precision measurement with a large measurement range and high accuracy for all kinds of measurements
The infinite long-distance brightfield metallographic objective lens is selected to meet the measurement requirements of long working distance
The lighting fixtures (reflective/transmissive) can be illuminated with high-brightness LEDs or halogen illumination
Diffraction-free observation and measurement was carried out using a variable aperture diaphragm
Standard tables in all sizes
The quick-release device is convenient for measuring large or large workpieces on a fast-moving table
Observation with a high eyepiece
Spectrum HD Digital Camera CCD Image Imaging (12 Million HD Pixels Optional)
Teelen WTN-202S Tool measurement MicroscopeSpecifications
| LIST | VALUE |
|---|---|
| X Coordinate Travel | 200（mm） |
| Y coordinate Travel | 200（mm） |
| Z Coordinate Travel | 100（mm） |
| X, Y coordinate measurement Indication Error | ≤ (3 + L/150) µm, L is the measured length (unit: mm) |
| X, Y, Z digital display resolution | 0.0001Mm (Xintian Optoelectronics) |
| Transmissive Illuminant | 24V/20W halogen tungsten lamp (WNS) |
| Reflection Illuminant | Variable field and aperture diaphragms, both center adjustable, with color filter slot and polarizer slot; (WNS) |
| visual system | / |
| objective magnification | Hole swirl/spin, standard 5X, 10X, 20X, 50X infinity telephoto working distance, positive image Bright & Dark Field Metallographic Objective (WNS) |
| Eyepiece magnification | 10X (single and binocular) (WNS) |
| total magnification | 50X-500X (including distortion) |
| Objective lens magnification error | Magnification error ≤ 0.08% |
| Imaging system | / |
| Standard | CCD camera 0.5X lens (WNS) |
| CCD | Map high definition digital camera CCD image imagery (12 million high definition pixels optional) |
| Maximum magnification of comprehensive image | 1000X or more |
Teelen WTN-202S Tool measurement Microscope Packing list
[Note] Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.