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![]() Leeb leeb452 Roughness Gauge
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![]() AMITTARI AR-132C Surface roughness meter
4550.0 RMB
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| Principle | Contact type | Contact type | |||
|---|---|---|---|---|---|
| Type | Portable | Portable | |||
| Display | digital display | digital display | |||
| Method | Needle tracing | Needle tracing | |||
| Parameters | Ra Rz | Ra Rz | |||
| Function | Surface Roughness | Surface Roughness | |||
| Sample | General workpiece | General workpiece | |||
| Probe | Integrated | Integrated | |||
| Certificate | No certificate | No certificate | |||
| Display | digital display | ||||
|---|---|---|---|---|---|
| Measurement parameters | Ra、Rz | Ra、Rz | |||
| Measuring range | Ra: 0.05 ~ 10.0μmRz: 0.1 ~ 50μm | ||||
| resolution | |||||
| Error of indication | ≤±15% | ≤±15% | |||
| Indication of variability | <12% | ||||
| Sampling length | 0.25mm|0.8mm|2.5mm | 0.25Mm | 0.8mm | 2.5mm (optional) | |||
| Evaluation length | 1.25mm、4mm、5mm | ||||
| scan length | 6mm | ||||
| Sensors - Radius | 10μm | ||||
| Sensors - Materials | piezoelectric crystal | diamond | |||
| Sensors - Force Measurement | 4mN | ||||
| Sensors - Angle | 90° | ||||
| Sensors - measurement principle | |||||
| Sensors - Longitudinal Radius | 48mm | ||||
| Maximum drive stroke | |||||
| Drive speed - when measuring | When sampling length = 0.25mm, Vt = 0.135mm/s; when sampling length = 0.8mm, Vt = 0.5mm/s; when sampling length = 2.5mm, Vt = 1mm/s | ||||
| Drive speed - when returning | Vt=1mm/s | ||||
| filter | RC、PC-RC、GAUSS、D-P | ||||
| Measurement profile | Roughness | Asperity | |||
| Storage Capacity | |||||
| Data Interface | |||||
| Power | 3.7V lithium-ion battery | ||||
| Dimensions | 106*70*24mm | 128*80*30mm | |||
| Product Weight | 200g | 420g | |||
| Operating Conditions | Temperature 0℃ - 40℃ | ||||
| Applicable standard | GB/T 3505-2000、GB/T 6062-2002 | ||||
| Standard configuration | Host, power adapter, multi-reticle template (Roughness standard block) | ||||
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