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 AMITTARI AR-132C Surface roughness meter
4550.0 RMB
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 Leeb leeb451 Roughness Gauge
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Model comparison
| Principle | Contact type | Contact type | |||
|---|---|---|---|---|---|
| Type | Portable | Portable | |||
| Display | digital display | digital display | |||
| Method | Needle tracing | Needle tracing | |||
| Parameters | Ra Rz | Ra Rz Rq Rt. | |||
| Function | Surface Roughness | Surface Roughness | |||
| Sample | General workpiece | General workpiece | |||
| Probe | Integrated | Integrated | |||
| Certificate | No certificate | No certificate | |||
Parameter comparison
| Display mode | digital explicit | ||||
|---|---|---|---|---|---|
| Measurement parameters | Ra、Rz | Ra、Rz、Rq、Rt | |||
| Measurement range | Ra:0.05~10.00μm/1.000~400.0uinch;Rz:0.020~100.0μm/0.780~4000uinch | ||||
| Resolution | 0.001μm|0.01μm|0.1μm | ||||
| Error of indication | ≤±15％ | ≤±15％ | |||
| Indication variability | ≤10％ | ||||
| Sampling length | 0.25Mm | 0.8mm | 2.5mm (optional) | 0.25mm|0.8mm|2.5mm | |||
| evaluation length | 1L~ 5L (optional, L is the sampling length) | ||||
| Stroke length | 17.5mm/0.7inch | ||||
| Sensors - Radius | 10μm | ||||
| Sensors - Materials | diamond | piezoelectric crystal | |||
| Sensors - Force Measurement | 4mN | ||||
| Sensors - Angle | 90° | ||||
| Sensors - Measurement principles | Inductance | ||||
| Sensors - Longitudinal Radius | 48mm | ||||
| Stroke length | 17.5mm/0.7inch | ||||
| Drive speed - when measuring | When sampling length = 0.25mm, Vt = 0.135mm/s; when sampling length = 0.8mm, Vt = 0.5mm/s; when sampling length = 2.5mm, Vt = 1mm/s | ||||
| Drive speed - when returning | Vt=1mm/s | ||||
| filter | RC、PC-RC、GAUSS、D-P | ||||
| Measurement profile | Asperity | Roughness | |||
| Data storage | 7 sets of measurement data | ||||
| Interface | RS232 | ||||
| Power Supply | 4 * 1.5vAA 5 #battery | ||||
| Dimensions | 128*80*30mm | 106*70*24mm | |||
| Product Weight | 420g | 200g | |||
| Operating Conditions | Temperature 0℃ - 40℃ | ||||
| Applicable standards | GB-T6062, ISO, DIN, ANSI and JIS four standards | ||||
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