PHYNIX Surfix® easy E-F and Leeb leeb242（F1） compare

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Model selection comparator If you have any questions, please click below Service	PHYNIX Surfix® easy E-F Easy-to-use external probe Iron-based Film thickness meter In coming Germany Detail	Leeb leeb242（F1） Coating Thickness Gauge Login China Detail

Model comparison

Principle	Magnetic	Magnetic
Substrate	Ferrous	Ferrous
Range	0 ~ 6000μm	0 ~ 1500m
Precision	±2% Miscellaneous	±3%
Certificate	Without	Without
Probe	Split probe	Split probe
Application	General	General
Accessories

Parameter comparison

Measurement principle	magnetic Induction	magnetic induction
Measurement range	0~3500µm
margin of error	±2%	±3%
resolution	1μm	0.1µm
Minimum measurement surface	Φ10mm	F7mm
Minimum radius of curvature	Convex 2mm; concave 50μm	Convex 1.5mm; Concave 9mm
thinnest substrate	0.5mm
probe	Wired probe	F1 Split Probe
statistical function	MAX Maximum, MIN Minimum, Average, Standard deviation
icon function	none	without
Power Supply	2 * AAA Battery
Standards	DIN、ISO、ASTM、BS
Calibrated Certificate	Production inspection Certificate	without
system language	German, English or French
Display screen	Monochrome ink screen	LCD
Interface
supporting software		without
Weight	140G (including battery)
Dimension	1105025mm

Friendly reminder: This page is a comparison of PHYNIX Surfix® easy E-F,Leeb leeb242（F1）.NBCLab only provides you with the similarities and differences of the product in the model and specifications.

For more information about PHYNIX Surfix® easy E-F,Leeb leeb242（F1）similarities and differences, please refer to the NBCLab product details.

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