The EN 15042-1-2006 standard provides detailed instructions on how to determine the resilience constant, Density and Film thickness of thin films using the laser-induced surface acoustic wave method. The first part of the standard clarifies the relevant terminology and procedures for the measurement of the physical properties of thin films by laser-generated surface acoustic waves, which are important for thin film analysis in the fields of materials science and engineering.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | ICS | (17.040.20) 表面特征 | |
| Release Date | 2006-03-31 00:00:00 | Implementation Date | 2006-04-01 00:00:00 |