The JIS K7130-1999 standard specifies the method for the determination of Film thickness of Plastic films and thin plates. The standard contains three test methods: A method (mechanical scanning method), B1 method (sample mass method) and B2 method (mass method of rolled products). These methods provide a standardized process for Film thickness measurement of Plastic films and thin plates, which is important for quality control, material characteristic evaluation and industrial production. The standard ensures the accuracy and conformity of the measurement results and is suitable for Film thickness measurement of various plastic materials.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | (G31) 合成树脂、塑料基础标准与通用方法 | ICS | (83.140.10) 薄膜和薄板 |
| Release Date | 1999-10-31 00:00:00 | Implementation Date | 1999-10-31 00:00:00 |