This standard specifies a method for the determination of iron, aluminum, calcium, mg, manganese, zinc, copper, titanium, chromium, nickel and vanadium content in metallic silicon using Inductance Coupled Plasma Atomic Emission Spectroscopy (AES) (ICP AES) method. It is applicable to the determination of iron, aluminum, calcium, mg, manganese, zinc, copper, titanium, chromium, nickel and vanadium content in metallic silicon. The determination range of each element is shown in Table 1. Normative reference documents include GB/T 4010, GB/T 6682, etc. The principle of the method involves sample dissolving, diluting, Inductance Plasma Coupled Atomic EmissionSpectrometer determination, and calculating the content of each element according to the standard Linear dispersion. Reagents include muriatic acid, nitric acid, hydrofluoric acid, sulfuric acid, etc. It should be noted that the acid solution used in the test has strong corrosion.