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      GB/T 43682-2024 "Nanotechnology, Measuring method of carrier Mobility and block resistance of sub-nanometer thick graphene films" describes in detail the Hall device sample preparation of sub-nanometer thick graphene films and the Measurement principle, equipment, measurement process, calculation method and uncertainty analysis of carrier Mobility and block resistance. This standard applies to sub-nanometer thick graphene films with a length and width greater than 100 μm for the measurement of carrier Mobility and block resistance below 10 ^ 4 cm ²/Vs. Hall effect measurement of the transverse potential difference of samples under the action of current and vertical magnetic field to evaluate the electrical performance of graphene films provides accurate measurement reports and Data analysis to ensure Reliability and accuracy of measurement results.

      This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
      Status Active
      CCS A42 ICS 71.040.50
      Release Date 2024-03-15 00:00:00 Implementation Date 2024-07-01 00:00:00
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