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      GB/T 45769-2025 "X-ray photoelectron spectroscopy for surface chemical analysis, evaluation and reporting of element detection limits in homogeneous materials" stipulates the method of evaluating and reporting element detection limits in homogeneous materials by X-ray photoelectron spectroscopy, including principles, steps, calculations and reporting requirements. The standard is applicable to related tests in the field of surface chemical analysis. It provides a basis for unifying the evaluation specifications of element detection limits and ensuring the Reliability and comparability of analysis results. It is of great significance to promote the standardization of surface analysis technology.

      This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
      Status Incoming
      CCS G 04 ICS 71.040.40
      Release Date 2025-06-30 00:00:00 Implementation Date 2026-01-01 00:00:00
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