This standard specifies a method for the simultaneous determination of the thickness and electrochemistry potential of each layer in multilayer nickel platings. Through this method, the thickness of nickel platings and the electrochemistry potential of each layer can be measured simultaneously, providing comprehensive platings characteristic data. The standard details the measurement procedures, equipment requirements and Data analysis methods, which help to improve the control accuracy of platings mass and performance.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | ICS | ||
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