This standard specifies a method for measuring the cross-sectional thickness of metal overlays using sem. The standard describes in detail the measurement procedures, technical requirements and data processing methods to ensure accurate measurement of the thickness of metal overlays. This method is suitable for testing the uniformity and thickness of metal overlays and is widely used in the fields of materials science and quality control.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Abolish | ||
|---|---|---|---|
| CCS | ICS | ||
| Release Date | Implementation Date | ||