Search
    Cart(0)
      总价
      前往结算
      您的购物车是空的 : )

      ASTM B567-98 (2021) describes a method for nondestructive measurement of Coating thickness on metallic and Non-metallic substrates using beta backscattering. This method is suitable for cases where the atomic number of the coating and the substrate match, and the mass or thickness of the coating can be measured (assuming the coating density is known). Although beta backscattering provides a reliable measurement method, it requires handling of radioisotopes when using this method, and users are required to comply with relevant safety and radioactive material handling regulations.

      This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
      Status Active
      CCS ICS
      Release Date Implementation Date
      0 in total
      filter
      Featured Hot Price Time
      Focus on online sales of Lab Testing Instruments