GB/T 2423.1-2008 standard defines the test method for electrical and electronic products in a low temperature environment. The standard specifies the conditions, steps and requirements for low temperature testing to test the adaptability and Reliability of products in a low temperature environment and ensure the performance Stability under cold conditions.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | K04 | ICS | 19.040 |
| Release Date | 2008-12-30 00:00:00 | Implementation Date | 2009-10-01 00:00:00 |
