This standard specifies the terms, technical requirements, test methods, inspection rules and the content of marking, Encasement and storage of low-temperature test chambers. It is suitable for low-temperature environmental testing of electrical, electronic products and Miscellaneous materials. The standard covers the use conditions, technical performance and inspection requirements of the test chamber to ensure the Reliability and accuracy of the test chamber in low-temperature testing. It mainly refers to the relevant Encasement marks, low-voltage switchgear standards and noise measurement standards, and aims to provide standardized operation and testing guidelines for low-temperature testing.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | N61 | ICS | 71.040.10 |
| Release Date | 2008-06-30 00:00:00 | Implementation Date | 2009-01-01 00:00:00 |
