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      GB/T 17886.2-1999 "Non-self-healing shunt capacitors for AC power systems with nominal voltages of 1 kV and below, Part 2: Aging test and destruction test" standard specifies the aging test and destruction test methods for non-self-healing shunt capacitors for AC power systems. The standard describes in detail the test equipment, conditions, procedures and evaluation methods to verify the Reliability and safety of capacitors in long-term use. Through these tests, it is possible to ensure that the capacitor maintains stable electrical performance under normal operating conditions and prevents potential failures due to aging or destruction, thereby improving the overall Reliability of the power system.

      This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
      Status Active
      CCS K42 ICS 31.060.70
      Release Date 1999-10-10 00:00:00 Implementation Date 2000-05-01 00:00:00
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