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      This standard specifies methods for accelerated testing of components under constant heat and humidity conditions, mainly for evaluating the long-term Stability of electrical and electronic components in high Humidity, high temperature environments. Reliability and durability of components in practical applications are ensured by simulating long-term exposure to extreme heat and humidity conditions.

      This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
      Status Active
      CCS K04 ICS 19.040
      Release Date 2012-11-05 00:00:00 Implementation Date 2013-02-01 00:00:00
      316 in total
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      Aipei AP-HX-30A electronic humidity chamber 30L/0 ℃
      $3739.00 SE
      Aipei AP-HX-30A electronic humidity chamber 30L/0 ℃
      30L0 ℃~ + 150 ℃ (air-cooled)20%~98%RH
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      APE-HX-30B programmable humidity chamber 30L/-20 ℃
      $3957.00 SE
      APE-HX-30B programmable humidity chamber 30L/-20 ℃
      30L-20 ℃~ + 150 ℃ (air-cooled)20~98%R.H
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      APE-HX-50A Programmable Constant Temperature and Humidity Chamber 50L/0 ℃
      $3848.00 SE
      APE-HX-50A Programmable Constant Temperature and Humidity Chamber 50L/0 ℃
      50L0 ℃~ + 150 ℃ (air-cooled)20%~98%RH
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      Aipei AP-HX-1000C high and low temperature alternating damping heat test chamber 1000L/-40 ℃
      $7906.00 SE
      Aipei AP-HX-1000C high and low temperature alternating damping heat test chamber 1000L/-40 ℃
      1000L-40 ℃~ + 150 ℃ (air-cooled)20%~98%RH
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      Aipei AP-HX-225A programmable constant temperature and humidity testing device 225L/0 ℃
      $5263.00 SE
      Aipei AP-HX-225A programmable constant temperature and humidity testing device 225L/0 ℃
      225L0 ℃~ + 150 ℃ (air-cooled)20%~98%RH
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      Aipei AP-HX-150B high and low temperature damping heat test chamber 150L/-20 ℃
      $4501.00 SE
      Aipei AP-HX-150B high and low temperature damping heat test chamber 150L/-20 ℃
      150L-20 ℃~ + 150 ℃ (air-cooled)20%~98%RH
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