The standard "GB/T 40066-2021 Nanotechnology Oxidation Graphene Film thickness measurement Atomic Force Microscope Law" specifies the specific method of using Atomic Force Microscope (AFM) for the measurement of oxidation graphene Film thickness, including sample preparation, measurement procedure and result calculation. The standard applies to Film thickness measurement of oxidation graphene samples with a sheet diameter of not less than 300 nm, and can also be used for film thickness measurement of Miscellaneous similar 2D materials. Through this standard, the film thickness of oxidation graphene and related materials can be accurately evaluated, thus providing reliable data support for nanotechnology and materials research.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | A40 | ICS | 17.180 |
| Release Date | 2021-05-21 00:00:00 | Implementation Date | 2021-12-01 00:00:00 |