GB/T 20724-2006 stipulates the method of measuring thin crystal Film thickness by convergent beam electron diffraction. The standard covers measurement principles, instrumentation, sample preparation and operation procedures, specifies diffraction conditions, data collection and analysis methods, and accurately determines thin crystal Film thickness by convergent beam electron diffraction technology. Provide scientific and standardized measurement methods and unified standards for thin crystal material research, production mass testing, etc.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Abolish | ||
|---|---|---|---|
| CCS | N53 | ICS | 71.040.99 |
| Release Date | 2006-12-25 00:00:00 | Implementation Date | 2007-08-01 00:00:00 |