This standard specifies a method for the determination of copper content in industrial silicon using atomic absorption spectroscopy (AAS), suitable for copper content in the range of 0.0010% to 0.50%. The summary of the method includes the use of hydrofluoric acid and nitric acid to dissolve the sample, and the measurement of copper Absorbance at specific wavelengths after removing interfering elements by perchloric acid treatment. The standard describes in detail the reagent formulation, instrument requirements and determination procedures, providing a scientific basis for the analysis of copper content in industrial silicon.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | H12 | ICS | 77.120.10 |
| Release Date | 2015-09-11 00:00:00 | Implementation Date | 2016-08-01 00:00:00 |
