GB/T 24579 - 2009 is a polysilicon testing standard, which stipulates the use of acid leaching - atomic absorption spectroscopy (AAS) method to determine metal contaminants on the surface of polysilicon. Polysilicon is an important semiconductor material, and its surface metal contaminants affect product performance and mass. The standard provides a standardized testing process to help enterprises accurately grasp the metal contamination on the surface of polysilicon, improve product quality by controlling contaminants, and play a key role in the mass control of polysilicon production, semiconductor manufacturing and other related industries.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | H80 | ICS | 29.045 |
| Release Date | 2009-10-30 00:00:00 | Implementation Date | 2010-06-01 00:00:00 |
