The GB/T 42676-2023 standard introduces the method of measuring the crystal mass of semiconductor single crystals by X-Rays diffraction method. This method is suitable for evaluating the structural integrity and crystal mass of semiconductor single crystals, and determining the mass crystallization by analyzing the crystal plane, lattice parameters and crystal structure characteristics of the crystal. This standard ensures the accuracy and Reliability of the test process and provides an important quality control means for the production and application of semiconductor materials.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | H21 | ICS | 77.040 |
| Release Date | 2023-08-06 00:00:00 | Implementation Date | 2024-03-01 00:00:00 |