GB/T 4937.42-2023 is a part of the semiconductor device test method standard. This part specifies the environmental conditions of the test, including precise temperature, Humidity range and fluctuation requirements. Specify the performance indicators of the test equipment, such as the accuracy of the Humidity box. Standardize the test process, from sample preparation, placement to monitoring Frequency. By simulating the actual storage environment, the performance Stability of the device under the long-term action of Humidity is tested, which provides a basis for the semiconductor device production, storage and use enterprises to evaluate the reliability of the product and ensure the mass of the device.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | L40 | ICS | 31.080.01 |
| Release Date | 2023-05-23 00:00:00 | Implementation Date | 2023-12-01 00:00:00 |