GB/T 2 2461.2 - 2023 belongs to the standard system of surface chemical analysis. This part specifies the terminology of focused scanning probe microscopy. It unifies the specific vocabulary in this field, covering equipment such as Atomic Force Microscope and scanning tunnel Microscope and related technical terms. Give precise definitions of various terms, such as probe, scanning mode, imagery resolution, etc., to clarify their connotation and application scope. Provide a unified language foundation for the scientific research, detection and teaching of scanning probe microscopy in the field of surface chemical analysis, eliminate differences in terminology understanding, and promote communication and collaboration and industry development.