GB/T 43087-2023 is a standard for analytical electron microscopy in microbeam analysis. The standard focuses on layered materials and specifies a method for determining the interface position in their cross-sectional images. This standard provides a uniform specification for the accurate analysis of the microstructure of layered materials, which is helpful for the precise study and control of the interface properties of layered materials in related scientific research and industrial production.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | N33 | ICS | 71.040.50 |
| Release Date | 2023-09-07 00:00:00 | Implementation Date | 2024-04-01 00:00:00 |