This standard specifies a test method for determining the lifetime of non-equilibrate minority carriers in non-intrinsic silicon and germanium single crystals by photoconductivity attenuation method. The test methods include DC photoconductivity attenuation-pulsed light method and high-frequency photoconductivity attenuation method, which are suitable for measurement of cuboid or cylinder samples and rod or block samples. The shortest life value for silicon single crystals is 50p μs, and the shortest life value for germanium single crystals is 10 μs.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | H21 | ICS | 77.040 |
| Release Date | 2023-08-06 00:00:00 | Implementation Date | 2024-03-01 00:00:00 |