Measuring methods for the resistivity of nanomaterials are specified in this standard, including static four-probe method (A method) for nano-thin films, slurries and powders, and dynamic four-probe method (B method) and dynamic two-probe method (C method) for nano-powder resistivity measurement.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | H21 | ICS | 17.220.20 |
| Release Date | 2021-05-21 00:00:00 | Implementation Date | 2021-12-01 00:00:00 |