This standard specifies the test method for solids by volume of precious metal slurry for microelectronics technology. It is suitable for the determination of solids by volume of precious metal slurry for various sintering and curing microelectronics technologies.
This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.
| Status | Active | ||
|---|---|---|---|
| CCS | H68 | ICS | 77.120.99 |
| Release Date | 2008-03-31 00:00:00 | Implementation Date | 2008-09-01 00:00:00 |